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    Determination of albedo parameters of the organometallic halide perovskite films
    (Pergamon-Elsevier Science Ltd, 2020) Yilmaz, Demet; Baltakesmez, Ali; Uzunoglu, Zeynep; Biber, Mehmet
    In this work, albedo number, energy and dose of the perovskite films were determined by the gamma ray spectrometry. The MAPbBr(3-x)Cl(x), MAPbBr(3-x)I(x), MAPbl(3-x)Cl(x) and MAPbl(3) thin films were coated on the Pedot:PSS/ITO substrates by static spin coating technique. The structural properties of the films were determined with field emission scanning electron microscopy (FE-SEM) images and X-ray diffraction (XRD) patterns. Albedo parameters of perovskite films were carried out by using a high purity germanium detector with a resolution of 182 eV at 5.9 keV and 59.54 keV gamma-rays emitted from a radioactive source of Am-241 (59.54 keV). In XRF experiments, the scattering angle was set 168 degrees. XRD patterns show that perovskite structure has forming tetragonal with high crystallinity. Also, the perovskite layer has compact and high coverage capability and uniform surface feature in terms of FE-SEM morphology. It is observed that albedo parameters are dependent on the density, the mean atomic number and the average band gap energy of perovskite films. Also, high energy radiation scattering from the perovskite films appears to be enhanced significantly with the MABr treatment.