A Lossy Capacitance Measurement Circuit Based on Analog Lock-in Detection

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dc.contributor.authorDemirtas, Mehmet
dc.contributor.authorErismis, Mehmet Akif
dc.contributor.authorGunes, Salih
dc.date.accessioned2024-02-23T14:44:42Z
dc.date.available2024-02-23T14:44:42Z
dc.date.issued2020
dc.departmentNEÜen_US
dc.description.abstractThis paper presents a lossy capacitance measuring circuit which is based on analog lock-in detection technique. Lossy capacitance can be modelled as a pure capacitor connected in parallel with a resistor. The measurement circuit mechanism consists of an excitation signal to drive the lossy capacitance, a transimpedance amplifier to produce a voltage, and a lock-in detection circuit to extract lossy values of capacitance. The lock-in detector multiplies its input with a square wave using switches and filters out high frequencies to give a DC output that is actually in proportional to the measured values. A field programmable gate array is employed to generate direct digital synthesis based sinusoidal excitation signal to generate reference signals required for demodulation and to measure the output of lock-in detection. The phase shift between the excitation signal and reference signals is controlled accurately in digital domain. Thus, due to the phase mismatch, errors are properly reduced. Also, analog phase shifter and analog switch-driving circuits are no longer required. Three different lossy capacitors realized using discrete components are simulated and tested. The maximum relative error is 1.62 % for the resistance measurement and 6.38 % for the capacitance measurement.en_US
dc.identifier.doi10.5755/j01.eie.26.5.25809
dc.identifier.endpage10en_US
dc.identifier.issn1392-1215
dc.identifier.issue5en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.startpage4en_US
dc.identifier.urihttps://doi.org/10.5755/j01.eie.26.5.25809
dc.identifier.urihttps://hdl.handle.net/20.500.12452/17072
dc.identifier.volume26en_US
dc.identifier.wosWOS:000584468500001en_US
dc.identifier.wosqualityQ4en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.language.isoenen_US
dc.publisherKaunas Univ Technologyen_US
dc.relation.ispartofElektronika Ir Elektrotechnikaen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectDemodulationen_US
dc.subjectField Programmable Gate Arraysen_US
dc.subjectLock-In Detectionen_US
dc.subjectLossy Capacitanceen_US
dc.titleA Lossy Capacitance Measurement Circuit Based on Analog Lock-in Detectionen_US
dc.typeArticleen_US

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