Positive and Negative Photoconductivity in Ir Nanofilm-Coated MoO3 Bias-Switching Photodetector
dc.contributor.author | Kabatas, Mohamed A. Basyooni-M. | |
dc.contributor.author | En-nadir, Redouane | |
dc.contributor.author | Rahmani, Khalid | |
dc.contributor.author | Eker, Yasin Ramazan | |
dc.date.accessioned | 2024-02-23T14:35:15Z | |
dc.date.available | 2024-02-23T14:35:15Z | |
dc.date.issued | 2023 | |
dc.department | NEÜ | en_US |
dc.description.abstract | In this study, we delved into the influence of Ir nanofilm coating thickness on the optical and optoelectronic behavior of ultrathin MoO3 wafer-scale devices. Notably, the 4 nm Ir coating showed a negative Hall voltage and high carrier concentration of 1.524 x 10(19) cm(-3) with 0.19 nm roughness. Using the Kubelka-Munk model, we found that the bandgap decreased with increasing Ir thickness, consistent with Urbach tail energy suggesting a lower level of disorder. Regarding transient photocurrent behavior, all samples exhibited high stability under both dark and UV conditions. We also observed a positive photoconductivity at bias voltages of >0.5 V, while at 0 V bias voltage, the samples displayed a negative photoconductivity behavior. This unique aspect allowed us to explore self-powered negative photodetectors, showcasing fast response and recovery times of 0.36/0.42 s at 0 V. The intriguing negative photoresponse that we observed is linked to hole self-trapping/charge exciton and Joule heating effects. | en_US |
dc.description.sponsorship | Selcuk University-Scientific Research Projects Coordination (BAP) Unit [22211012] | en_US |
dc.description.sponsorship | Selcuk University-Scientific Research Projects Coordination (BAP) Unit supported the project (22211012). | en_US |
dc.identifier.doi | 10.3390/mi14101860 | |
dc.identifier.issn | 2072-666X | |
dc.identifier.issue | 10 | en_US |
dc.identifier.pmid | 37893298 | en_US |
dc.identifier.scopus | 2-s2.0-85175366184 | en_US |
dc.identifier.uri | https://doi.org/10.3390/mi14101860 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12452/15945 | |
dc.identifier.volume | 14 | en_US |
dc.identifier.wos | WOS:001099398600001 | en_US |
dc.indekslendigikaynak | Web of Science | en_US |
dc.indekslendigikaynak | Scopus | en_US |
dc.indekslendigikaynak | PubMed | en_US |
dc.language.iso | en | en_US |
dc.publisher | Mdpi | en_US |
dc.relation.ispartof | Micromachines | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.subject | Molybdenum Oxide | en_US |
dc.subject | Atomic Layer Deposition | en_US |
dc.subject | Sputtering Deposition | en_US |
dc.subject | Urbach Tail Energy | en_US |
dc.subject | Low Roughness Optoelectronic Devices | en_US |
dc.title | Positive and Negative Photoconductivity in Ir Nanofilm-Coated MoO3 Bias-Switching Photodetector | en_US |
dc.type | Article | en_US |