Microstructural, mechanical, and electrical characterization of directionally solidified Al-Cu-Mg eutectic alloy

Küçük Resim Yok

Tarih

2017

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayıncı

Maik Nauka/Interperiodica/Springer

Erişim Hakkı

info:eu-repo/semantics/closedAccess

Özet

The composition of an Al-Cu-Mg ternary eutectic alloy was chosen to be Al-30 wt% Cu-6 wt % Mg to have the Al2Cu and Al2CuMg solid phases within an aluminum matrix (alpha-Al) after its solidification from the melt. The alloy Al-30 wt % Cu-6 wt % Mg was directionally solidified at a constant temperature gradient (G = 8.55 K/mm) with different growth rates V, from 9.43 to 173.3 mu m/s, by using a Bridgman-type furnace. The lamellar eutectic spacings (lambda(E)) were measured from transverse sections of the samples. The functional dependencies of lamellar spacings lambda(E) ( lambda(Al2CuMg) and lambda(Al2Cu), in mu m), microhardness H-V (in kg/mm(2)), tensile strength sigma(T) (in MPa), and electrical resistivity rho (in Omega m) on the growth rate V (in mu m/s) were obtained as lambda(Al2CuMg)=3.05V(-0.31), lambda(Al2Cu)=6.35(-0.35),H-v = 308.3(V)(0.03) sigma(T)= 408.6(V)(0.14), and rho = 28.82 x 10(-8)(V)(0.11), respectively for the Al-Cu-Mg eutectic alloy. The bulk growth rates were determined as lambda(2)(Al2CuMg) V= 93.2 and lambda(2)(Al2Cu) V=195.76 mu m(3)/s by using the measured values of lambda(Al2CuMg), lambda(Al2Cu) and V. A comparison of present results was also made with the previous similar experimental results.

Açıklama

Anahtar Kelimeler

Directional Solidification, Aluminum Alloys, Microstracture, Electrical Properties, Hardness Test

Kaynak

Physics Of Metals And Metallography

WoS Q Değeri

Q3

Scopus Q Değeri

Q3

Cilt

118

Sayı

4

Künye