Dielectric characterization of Al/PCBM:ZnO/p-Si structures for wide-range frequency
Küçük Resim Yok
Tarih
2021
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Indian Acad Sciences
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
The dielectric properties of the Al/PCBM:ZnO/p-Si structure were investigated using the impedance spectroscopy technique. PCBM:ZnO layer was obtained by spin coating method on the p-Si. The morphological properties of the PCBM:ZnO were investigated using atomic force microscopy. The results highlighted that PCBM:ZnO thin film has uniform surfaces. The dielectric parameters such as real and imaginary parts of the electric modulus (M ' and M '') and ac electrical conductivity (sigma), dielectric constant (epsilon '), dielectric loss (epsilon ''), loss tangent (tan delta) values were determined. The results of the dielectric properties of the Al/PCBM:ZnO/p-Si structures impressed voltage and frequency changing. The Al/PCBM:ZnO/p-Si structures can be regarded as a candidate for organic diode applications.
Açıklama
Anahtar Kelimeler
Pcbm, Zno, Dielectric Constant, Electric Modulus, Al/Pcbm:Zno/P-Si Structure
Kaynak
Bulletin Of Materials Science
WoS Q Değeri
Q4
Scopus Q Değeri
Q3
Cilt
44
Sayı
1
