Dielectric characterization of Al/PCBM:ZnO/p-Si structures for wide-range frequency

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dc.contributor.authorYildiz, Dilber Esra
dc.contributor.authorKocyigit, Adem
dc.contributor.authorErdal, Mehmet Okan
dc.contributor.authorYildirim, Murat
dc.date.accessioned2024-02-23T13:59:47Z
dc.date.available2024-02-23T13:59:47Z
dc.date.issued2021
dc.departmentNEÜen_US
dc.description.abstractThe dielectric properties of the Al/PCBM:ZnO/p-Si structure were investigated using the impedance spectroscopy technique. PCBM:ZnO layer was obtained by spin coating method on the p-Si. The morphological properties of the PCBM:ZnO were investigated using atomic force microscopy. The results highlighted that PCBM:ZnO thin film has uniform surfaces. The dielectric parameters such as real and imaginary parts of the electric modulus (M ' and M '') and ac electrical conductivity (sigma), dielectric constant (epsilon '), dielectric loss (epsilon ''), loss tangent (tan delta) values were determined. The results of the dielectric properties of the Al/PCBM:ZnO/p-Si structures impressed voltage and frequency changing. The Al/PCBM:ZnO/p-Si structures can be regarded as a candidate for organic diode applications.en_US
dc.description.sponsorshipSelcuk University BAP Office [19401034]; Hitit University BAP Office [FEF.19004.15.010, FEF01.13.003]en_US
dc.description.sponsorshipThis study was supported by Selcuk University BAP Office under Project Number 19401034 and Hitit University BAP Office under Project Numbers FEF.19004.15.010 and FEF01.13.003.en_US
dc.identifier.doi10.1007/s12034-020-02297-y
dc.identifier.issn0250-4707
dc.identifier.issn0973-7669
dc.identifier.issue1en_US
dc.identifier.scopus2-s2.0-85100549063en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.urihttps://doi.org/10.1007/s12034-020-02297-y
dc.identifier.urihttps://hdl.handle.net/20.500.12452/11326
dc.identifier.volume44en_US
dc.identifier.wosWOS:000617476200011en_US
dc.identifier.wosqualityQ4en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherIndian Acad Sciencesen_US
dc.relation.ispartofBulletin Of Materials Scienceen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectPcbmen_US
dc.subjectZnoen_US
dc.subjectDielectric Constanten_US
dc.subjectElectric Modulusen_US
dc.subjectAl/Pcbm:Zno/P-Si Structureen_US
dc.titleDielectric characterization of Al/PCBM:ZnO/p-Si structures for wide-range frequencyen_US
dc.typeArticleen_US

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